Philips Materials Research Diffractometer (Philips MRD) contains horizontal goniometer designed to provide analysis for a number of applications:

Texture analysis on all kinds of materials with a preferred orientation of the crystallites.

Phase analysis of samples with flat or irregular surfaces of thin films and of samples in glass capillaries.

Crystallography and Rietveld analysis on samples with flat or irregular surfaces or powder samples in glass capillaries.

Residual stress analysis of flat samples or irregularly shaped specimens.

High resolution rocking curve analysis, reciprocal space mapping and x-ray topography on (epitaxial) layers on single crystal substrates.